Evaluation of quarter to sub-quarter micron patterning in x-ray lithography.
نویسندگان
چکیده
منابع مشابه
Thermal Channel Noise of Quarter and Sub-Quarter Micron NMOS FET’s
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ژورنال
عنوان ژورنال: Journal of Photopolymer Science and Technology
سال: 1994
ISSN: 0914-9244,1349-6336
DOI: 10.2494/photopolymer.7.551